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The problem of far-field pattern estimation from near-field data measurements through determination of currents distribution on the aperture plane is considered. Extension minimum method is applied for currents estimation problem, which outperforms standard regularization technique, when there is a priori information about finiteness of unknown support of currents on aperture plane. Fourier transform applied afterwards to determine far-field pattern. Arc-shaped scanning geometry is used for numerical simulation. Results are presented for one-dimensional aperture case.

far-field pattern; aperture plane; currents distribution; extension minimum; near-field measurements; nonlinear regularization