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The knowledge of electrical parameters of dielectric materials it is necessary for the disign of the elements of radio electronic equipment and for the development of new technological processes. Among the known various methods the electric parameter measuring of dielectrics finds a very important place in the radiophysical mwthods, specifically the ones based on the resonance properties of electrodynamic structures. In this case the problem of the permittivity determination is reduced to the solution the electrodynamic equations for the given resonator and to experimental measuring its resonance frequency and Q-factor. The essential features required to the resonance method are a high accuracy, rare frequency spectrum of free oscillations of the resonator in the frequency range, reasonable wide class of measured materials and a variety of sizes and shapes of the samples. In the present work a possibility of the determination of the dielectric permittivity using the resonance properties of a two-layer waveguide dielectric resonator (WDR) is considered.