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Determination of antennas parameters with holographic methods requires measurement and processing of two dimensional antennas near-field data reading on a chosen surface. For obtaining express-information about antennas characteristics it is possible to be confine one self to the main pattern cuts knowledge. In such a cases it is expedient to use extended linear probes, which provide weighed summation of amplitude and phase distributions (AFD) along their length. Application of the extended probes is similar to a equivalent linear distributions method, where the summation of near-field data along some line is carry out with a computer.