Possibilities and challenges of material parameter extraction by THz time domain spectroscopy


  • Oleksandr Ju. Sushko Queen Mary, University of London, United Kingdom https://orcid.org/0000-0001-7738-6421
  • Rob S. Donnan Queen Mary, University of London, United Kingdom
  • Rostyslav F. Dubrovka Queen Mary, University of London, United Kingdom https://orcid.org/0000-0001-6900-1819
  • Bin Yang Queen Mary, University of London, United Kingdom
  • K. Shala Queen Mary, University of London, United Kingdom




There are some sources of uncertainty and misunderstanding in the process of material parameter extraction by THz Time Domain Spectrometry (THz-TDS) that are not initially evident. This article aims to analyze the most common mistakes in interpreting THz-TDS measurements. Experimental evidence is shown where relevant.


SIEGEL, PETER H. Terahertz Technology in Biology and Medicine. IEEE Trans. Microwave Theory Tech., Oct. 2004, v.52, n.10, p.2438-2447, doi: http://dx.doi.org/10.1109/TMTT.2004.835916.

TONOCHI, MASAYOSHI. Cutting-edge Terahertz Technology. Nature, Feb. 2007, v.1, p.97-105, doi: http://dx.doi.org/10.1038/nphoton.2007.3.

HANGYO, M.; TANI, M.; NAGASHIMA, T. Terahertz time-domain spectroscopy of solids: A review. Int. J. Infra. Mill. Waves, 2005, v.26, n.12, p.1661-1690, doi: http://dx.doi.org/10.1007/s10762-005-0288-1.

KRUGER, M.; FUNKNER, S.; BRUNDERMANN, E.; HAVENITH, M. Uncertainty and Ambiguity in Terahertz Parameter Extraction and Data Analysis. J. Infrared MilliTerahz Waves, 2010, doi: http://dx.doi.org/10.1007/s10762-010-9669-1.

PUPEZA, I.; WILK, R.; KOCH, M. Highly accurate optical material parameter determination with THz time-domain spectroscopy. Opt. Express, 2007,v.15, p.4335, doi: http://dx.doi.org/10.1364/OE.15.004335.

FEDERICI, J.F.; SCHULKIN, B.; HUANG, F.; GARY, D.; BARAT, R.; OLIVEIRA, F.; ZIMDARS, D. THz imaging and sensing for security applications- explosives, weapons and drugs. Semicond. Sci. Technol., 2005, v.20, p.266-280, doi: http://dx.doi.org/10.1088/0268-1242/20/7/018.

NASHIMA, S.; MORIKAWA, O.; TAKATA, K.; HANGYO, M. Measurement of optical properties of highly doped silicon by terahertz time domain reflection spectroscopy. Appl. Phys. Lett., 2001, v.79, p.3923, doi: http://dx.doi.org/10.1063/1.1413498.

HANGYO, M.; NAGASHIMA, T.; NASHIMA, S. Spectroscopy by pulsed terahertz radiation. Meas. Sci. Technol., 2002, v.13, p.1727-1738, doi: http://dx.doi.org/10.1088/0957-0233/13/11/309.

JEPSEN, P.U.; FISCHER, B.M. Dyna mic range in Terahertz TimeDomain Transmission and Reflection Spectroscopy. Opt. Lett., 2005, v.30, p.29-31, doi: http://dx.doi.org/10.1364/OL.30.000029.

ZEITLER, J. AXEL; TADAY, PHILIP F.; NEWNHAM, DAVID A.; PEPPER, M.; GORDON, KEITH C.; RADES, T. Terahertz pulsed spectroscopy and imaging in the pharmaceutical setting - a review. JPP, 2007, v.59, p.209-223, doi: http://dx.doi.org/10.1211/jpp.59.2.0008.

KAUSHIK, M.; NG, BRIAN W.-H.; FISCHER, BERND M.; ABBOTT, D. Mitigating Scattering Effects in THz-TDS Measurements. Proc. of 35 Int. Conf. on Infrared Millimeter and Terahertz Waves, IRMMW-THz, 5-10 Sept. 2010, Rome. IEEE, 2010, p.1-2, doi: http://dx.doi.org/10.1109/ICIMW.2010.5612470.

SHEN, Y.C.; TADAY, P.F.; PEPPER, M. Elimination of scattering effects in spectral measurement of granulated materials using terahertz pulsed spectroscopy. Appl. Phys. Lett., 2008, v.92, p.051103, doi: http://dx.doi.org/10.1063/1.2840719.

MICKAN, S.; XU, JINGZHOU; MUNCH, J.; ZHANG, X.-C.; ABBOTT, D. The limit of spectral resolution in THz time-domain spectroscopy. Proc. of SPIE, 2004, v.5277, doi: http://dx.doi.org/10.1117/12.530386.